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| 262094 | |
Szymon Stradowski
Improving quality and minimizing costs of software development of 5G systems at Nokia using machine learning. 263 s.
Priorytetowe Obszary Badawcze: 1
| 2026 | |
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2
| 255959 | 105004412682 |
Szymon Stradowski, Lech Madeyski
“Your AI is impressive, but my code does not have any bugs” managing false positives in industrial contexts. Science of Computer Programming 2025 vol. 246, art. 103320, s. 1-5.
| 2025 | |
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3
| 252536 | 105003030143 |
Szymon Stradowski, Lech Madeyski
Interpretability/explainability applied to machine learning software defect prediction: An industrial perspective. IEEE Software 2025 vol. 42, nr 3, s. 125-132. [Publikacja zarejestrowana jako preonline dn. 10.01.2025, rok zaliczenia 2025. Wersja ostateczna zarejestrowana 08.04.2025, rok zaliczenia 2025.]
| 2025 | |
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4
| 253842 | 85216854849 |
Lech Madeyski, Szymon Stradowski
Predicting test failures induced by software defects: a lightweight alternative to software defect prediction and its industrial application. Journal of Systems and Software 2025 vol. 223, art. 112360, s. 1-18. [Publikacja zarejestrowana jako preonline dn. 04.02.2025, rok zaliczenia 2025. Wersja ostateczna zarejestrowana 10.02.2025, rok zaliczenia 2025.]
| 2025 | |
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5
| 249424 | 85199027992 |
Szymon Stradowski, Lech Madeyski
Costs and benefits of machine learning software defect prediction: industrial case study. W: FSE 2024: Companion Proceedings of the 32nd ACM International Conference on the Foundations of Software Engineering / ed. Marcelo d'Amorim. New York, NY : Association for Computing Machinery, 2024. s. 92-103.
| 2024 | |
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6
| 242313 | 85179010967 |
Szymon Stradowski*, Lech Madeyski
Bridging the gap between academia and industry in machine learning software defect prediction: thirteen considerations. W: 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023, 11-15 September 2023, Echternach, Luxembourg : proceedings. Piscatway, NJ : IEEE, cop. 2023. s. 1098-1110.
| 2023 | |
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7
| 240481 | 85171854507 |
Szymon Stradowski*, Lech Madeyski
Can we knapsack software defect prediction? Nokia 5G case. W: 2023 IEEE/ACM 45th International Conference on Software Engineering: Companion Proceedings, ICSE-Companion 2023, Melbourne, Australia 15-16 May 2023 : Proceedings. Piscatway, NJ : IEEE, cop. 2023. s. 365-369.
[Publikacja zarejestrowana jako preonline dn. 12.07.2023, rok zaliczenia 2023. Wersja ostateczna zarejestrowana 19.07.2023, rok zaliczenia 2023.]
| 2023 | |
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8
| 239243 | 85150041533 |
Szymon Stradowski, Lech Madeyski
Industrial applications of software defect prediction using machine learning: a business-driven systematic literature review. Information and Software Technology 2023 vol. 159, art. 107192, s. 1-17.
| 2023 | |
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9
| 238238 | 85144824314 |
Szymon Stradowski, Lech Madeyski
Machine learning in software defect prediction: a business-driven systematic mapping study. Information and Software Technology 2023 vol. 155, art. 107128, s. 1-15.
| 2023 | |
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10
| 237046 | 85138479890 |
Szymon Stradowski, Lech Madeyski
Exploring the challenges in software testing of the 5G system at Nokia: a survey. Information and Software Technology 2023 vol. 153, art. 107067, s. 1-18.
| 2023 | |
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