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| 255251 | |
Michał Babij
Wielokanałowy system pomiaru ładunków w zakresie femtokulombów do zastosowań w detektorach promieniowania rentgenowskiego. 210 s.
Priorytetowe Obszary Badawcze: 7
| 2025 | |
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| 251486 | |
Michał Babij, Piotr Bielówka, Karol Malecha
The multichannel, femtocoulomb range electronic readout for GEM detectors with LTCC input circuits. W: 46th International Microelectronics and Packaging IMAPS Poland Conference, Gdańsk 22‐25 September 2024 : Book of abstract / ed. Piotr Jasiński. [Gdańsk : Gdańsk University of Technology, 2024]. s. 151-152.
Priorytetowe Obszary Badawcze: 7
| 2024 | |
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| 246218 | 85191005411 |
Jednostka: W12N, PRD, W11
Dominika Majchrzak*, Lan Maria Tran*, Michał Babij*, Jarosław Serafińczuk, Wojciech Olszewski*, Rafał Kuna*, Katarzyna Opołczyńska*, Adrianna M Piejko, Paweł Piotr Michałowski*, Robert Kudrawiec, Detlef Hommel*
Thickness and Mg doping of graded AlGaN layers:influence on contact layer's structural and electrical properties for DUV emitters. Materials Science in Semiconductor Processing 2024 vol. 178, art. 108452, s. 1-7.
| 2024 | |
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| 243967 | 85186720468 |
Dominika Majchrzak*, Lan Maria Tran*, Michał Babij*, Jarosław Serafińczuk, Łukasz Pawlaczyk, S Gorlanta*, Katarzyna Opołczyńska*, Robert Kudrawiec, Detlef Hommel*, Edyta Piskorska-Hommel*
Dislocation density as a factor compensating the polarization doping effect in graded p-AlGaN contact layers. Journal of Alloys and Compounds 2024 vol. 985, art. 174034, s. 1-8.
| 2024 | |
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| 241459 | 85174073578 |
Michał Babij, Piotr Bielówka, Szymon Gburek*, Karol Malecha
A segmental 2D readout board manufactured in printed circuit board technology for gas electron multiplier detectors. Sensors 2023 vol. 23, nr 19, art. 8095, s. 1-11.
| 2023 | |
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| 237870 | 85142889870 |
Piotr Bielówka, Michał Babij, Arkadiusz P Dąbrowski, Karol Malecha
The application of Low-Temperature Cofired Ceramics technology in Gas Electron Multiplier microstructures. Nuclear Instruments and Methods in Physics Research. A, Accelerators, Spectrometers, Detectors and Associated Equipment 2023 vol. 1047, art. 167749, s. 1-2.
| 2023 | |
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| 235766 | 85131460211 |
| 2022 | |
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| 235158 | 85128763034 |
Asar Ahmed*, Ashok Kumar*, Md Naimuddin*, Michał Babij, Piotr Bielówka
The qualification of GEM detector and its application to imaging. Journal of Instrumentation 2022 vol. 17, nr 4, art. P04002, s. 1-16.
| 2022 | |
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| 234466 | 85123698918 |
| 2022 | |
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10
| 231831 | 85104992754 |
Michał Babij, Wojciech Majstrzyk, Andrzej Sierakowski*, Paweł Janus*, Piotr Grabiec*, Zbigniew Ramotowski*, Andrew Yacoot*, Teodor Gotszalk
MEMS displacement generator for atomic force microscopy metrology. Measurement Science & Technology 2021 vol. 32, nr 6, art. 065903, s. 1-8.
| 2021 | |
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