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| 262485 | |
Damian Radziewicz, Justyna A Olejnik, Wojciech Kijaszek, Wojciech Dawidowski, Adriana Łozińska, Marek Badura, Beata Ściana
Technology and characterisation of AlGaAs based DBR structures for NIR VCSEL applications. W: 14th International Conference on Advances in Electronic and Photonic Technologies : proceedings of ADEPT, Nový Smokovec, High Tatras, Slovakia, June 15-18, 2026 / eds. S. Kováčová, J. Kováč, I. Lettrichová. Žilina : University of Žilina in EDIS-Publishing Centre of UZ, 2026. s. 59-62.
Priorytetowe Obszary Badawcze: 6
| 2026 | |
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| 257588 | 105014338384 |
| 2026 | |
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| 256723 | |
Jednostka: W12N, W10, PRK, PRI, PRB
Priorytetowe Obszary Badawcze: 4
| 2025 | |
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| 256574 | |
Wojciech Dawidowski, Jaroslav Bruncko*, Andrej Vincze*, Wojciech Kijaszek, Monika Wełna, Bartłomiej Staszak, Damian Radziewicz, Beata Ściana
Electro-optical characterization of transparent indium doped ZnO thin films. W: 13th International Conference on Advances in Electronic and Photonic Technologies : proceedings of ADEPT, Podbanské, High Tatras, Slovakia, June 15-18, 2025 / eds. D. Jandura, I. Lettrichova. [B.m. : University of Žilina in EDIS-Publishing Centre of UZ, 2025]. s. 35-38.
Priorytetowe Obszary Badawcze: 2, 6
| 2025 | |
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| 256577 | 105026636308 |
| 2025 | |
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| 254576 | 105003409653 |
| 2025 | |
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| 251244 | 85207290001 |
| 2024 | |
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| 249361 | |
Wojciech Kijaszek, Karol Kolasiński, Sergiusz Patela, Regina Paszkiewicz
Development of ellipsometric models of Diamond-like Carbon films deposited by the RF IC PECVD technique. W: 12th International Conference on Advances in Electronic and Photonic Technologies : proceedings of ADEPT, Podbanské, High Tatras, Slovakia, June 24-27, 2024 / eds. M. Feiler [i in.]. [B.m. : University of Žilina in EDIS-Publishing Centre of UZ, 2024]. s. 61-64.
Priorytetowe Obszary Badawcze: 2, 6
| 2024 | |
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| 247159 | |
Priorytetowe Obszary Badawcze: 6
| 2024 | |
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| 245014 | 85189340316 |
Jednostka: W11, W12N, PRD
Monika Mikulicz, Tristan Smołka, Michał D Rygała, Mikołaj Badura, Wojciech Kijaszek, Adriana Łozińska, Martin Kamp*, Marcin Motyka
Temperature dependence of refractive indices of InP, GaAs, AlAs, and In0.53Ga0.47As in the midinfrared spectral range determined by combined ellipsometry and Fourier-transform spectroscopy. Physical Review Applied 2024 vol. 21, nr 4, art. 044001, s. 1-11.
| 2024 | |
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