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| 229633 | 85097713437 |
Paweł Janus*, Dariusz Szmigiel*, Andrzej Sierakowski*, Maciej Rudek, Teodor Gotszalk
Active calibration reference of minimized height for characterization of scanning thermal microscopy systems. Ultramicroscopy 2021 vol. 221, art. 113188, s. 1-6.
| 2021 | |
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| 226791 | 85082297006 |
Bartosz Świadkowski, Tomasz Piasecki, Maciej Rudek, Michał J Świątkowski, Krzysztof R Gajewski, Wojciech Majstrzyk, Michał Babij, Andrzej Dzierka, Teodor Gotszalk
ARMScope – the versatile platform for scanning probe microscopy systems. Metrology and Measurement Systems 2020 vol. 27, nr 1, s. 119-130.
| 2020 | |
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| 222017 | 85049354299 |
| 2018 | |
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| 212748 | 85044212728 |
| 2018 | |
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| 211506 | 85029698605 |
| 2018 | |
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| 214722 | 85012187377 |
Paweł Janus*, Andrzej Sierakowski*, Piotr Grabiec*, Maciej Rudek, Wojciech Majstrzyk, Teodor Gotszalk
Micromachined active test structure for scanning thermal microscopy probes characterization. Microelectronic Engineering 2017 vol. 174, s. 70-73.
| 2017 | |
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| 208233 | 85012037102 |
| 2017 | |
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| 200289 | 84925394148 |
Manuel Hofer*, Tzvetan Ivanov*, Maciej Rudek, Daniel A Kopiec, Elshad Guliyev*, Teodor Gotszalk, Ivo Rangelow*
Fabrication of self-actuated piezoresistive thermal probes. Microelectronic Engineering 2015 vol. 145, s. 32-37.
| 2015 | |
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| 207944 | 84923032346 |
Paweł Janus*, Piotr Grabiec*, Andrzej Sierakowski*, Teodor Gotszalk, Maciej Rudek, Daniel A Kopiec, Wojciech Majstrzyk, Guillaume Boetsch*, Bernd Koehler*
Design, technology, and application of integrated piezoresistive scanning thermal microscopy (SThM) microcantilever. W: Scanning Microscopies 2014 : 16–18 September, 2014, Monterey, California, United States / eds. Michael T. Postek [i in.]. Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, cop. 2014. art. 92360R, s. 1-11.
| 2014 | |
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