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| 200331 | 84946835648 |
Grzegorz Wielgoszewski, Teodor Gotszalk
Scanning thermal microscopy (SThM): How to map temperature and thermal properties at the nanoscale. Advances in Imaging and Electron Physics 2015 vol. 190, s. 177-221.
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| 2015 | |
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| 2015 | |
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| 198623 | 84912001249 |
Jerzy Bodzenta*, Justyna Juszczyk*, Anna Kaźmierczak-Bałata*, Grzegorz Wielgoszewski
Photothermal measurement by the use of scanning thermal microscopy. International Journal of Thermophysics 2014 vol. 35, nr 12, s. 2316-2327.
| 2014 | |
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| 193562 | 84902456313 |
| 2014 | |
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| 2014 | |
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| 192097 | 84948674378 |
C. Kraeh*, A Popsecu*, M Schieber*, H Hedler*, Tomasz Bieniek*, Grzegorz Wielgoszewski, Magdalena Moczała, Jonathan J Finley*
Fabrication of high aspect ratio microtube arrays for 2D photonic crystals. Materials Research Express 2014 vol. 1, nr 2, s. 1-14.
| 2014 | |
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| 188264 | 84883129985 |
Tomasz Bieniek*, Grzegorz Janczyk*, Paweł Janus*, Piotr Grabiec*, Marek Nieprzecki*, Grzegorz Wielgoszewski, Magdalena Moczała, Teodor Gotszalk, Elizabeth Buitrago*, Montserrat Fernández-Bolaños Badía*, Adrian M Ionescu*
Silicon nanowires reliability and robustness investigation using AFM-based techniques. W: Electron Technology Conference 2013, 16-20 April 2013, Ryn, Poland / Paweł Szczepański, Ryszard Kisiel, Ryszard S. Romaniuk (eds.). Bellingham, Wash. : SPIE, cop. 2013. art. 89022L, s. 1-6.
| 2013 | |
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